Refereed Journals
2022
[1]Chixiao Chen, Jieming Yin, Yarui Peng, Maurizio Palesi, Wenxu Cao, Letian Huang, Amit Kumar Singh, Haocong Zhi, and Xiaohang Wang, “Design Challenges of Intra- and Inter- Chiplet Interconnection”, IEEE Design & Test, vol. 39, no. 6, pp. 99–109, 2022. BibTex DOI IEEE PDF
Refereed Conference Papers
2022
[2]Imam Al Razi, Whit Vinson, David Huitink, and Yarui Peng, “Electromigration-Aware Reliability Optimization of MCPM Layouts Using PowerSynth”, in Proc. IEEE Energy Conversion Congress and Exposition, pp. 1-8, Oct 2022. BibTex DOI IEEE PPT MP4 PDF
[1]Quang Le, Md. Maksudul Hossain, Tristan Evans, Yarui Peng, and H. Alan Mantooth, “Thermal Runaway Mitigation through Electrothermal Constraints Mapping for MCPM Layout Optimization”, in Proc. IEEE Design Methodologies Conference, pp. 1-6, Sep 2022. BibTex DOI IEEE PPT MP4 PDF
Thesis
2022
[1]Imam Al Razi, “Constraint-Aware, Scalable, and Efficient Algorithms for Multi-Chip Power Module Layout Optimization”, Ph.D. dissertation, University of Arkansas, Fayetteville, AR, 2022. BibTex PPT PDF